It improves throughput while maintaining compatibility with the established MBAV8 instrument. The V93000 Smart Scale Generation extends the V93000 for the broadest device coverage in a single platform with a full range of compatible tester classes (from the smallest A-class to the largest L-class) to maximize your return-on-investment. Agenda www.chiptest.in 3. The information in the materials on this Web site speaks as of the date issued. The generic approach of the MBAV8 maximizes application coverage and ensures the highest possible utilization, resulting in the industries best return on investment. 0000006781 00000 n 0000014977 00000 n Click on more information for further details. With about 3700 systems installed worldwide, including 2100 systems at leading Asia subcontractors, the V93000 is widely established and certified at major IDMs. ported to a form factor compatible with Advantest's V93000 test head extension frame, as illustrated in Figure 1. Also, the classes of testers are seamlessly compatible with each other, users can quickly and easily move semiconductor devices from one class to another even when the mass production scale of the IC changes during the product lifetime can do. The cards innovative architecture allows simultaneous and fully independent testing on as many as 32 instruments with totally different settings, significantly reducing the cost of test for complex mixed-signal devices. Advantest's Direct Probereduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. 0000012694 00000 n Coverage from simple low end devices to the most complex high end products requiring the full suite of capabilities: dc, digital, analog and RF. A graphical test flow editor links device tests into a production-ready test program, where the tests are set up via fill-in-the-blank test functions. Direct Probe is mechanically designed and engineered for contact force management and with the planarity to support large surfaces and high pin counts at wafer test. Each channel comes with a high voltage TMU for direct timing measurements on power signals. The wide application coverage results in unprecedented asset utilization and manufacturing flexibility. . 0000008392 00000 n RF is ubiquitous, found in cell phones, satellite-based navigation, tuners, set-top boxes, WLAN, Bluetooth, FM Radio, UWB, PCs and laptops. ProgramGenerator. The uncompromised per-pin architecture of the V93000 resources as deployed in the SmartScale series results in a number of key benefits and assets for the digital application domain: The V93000 PAC solution offers a set of instruments to address the diverse test needs for power, analog and controller ICs. The cards advanced architectures allow for highly parallel testing of multiple communication standards or multiple paths within each device, resulting in high multi-site efficiency and a much lower cost of test. Industry-leading digital performance and high-speed I/O flexibility, Enhanced SmarTest software functionality, With Advantest's V93000 Direct Probe solution, manufacturers can now take a major step forward toward complete high performance functional testing at wafer probe and, Maximum test resource utilization, high parallelism and high throughput for lowest cost of test, Shorter hardware development time and cost due to innovative probe card design, High-performance signal integrity from tester pin electronics to probe tip, Mechanically designed for contact force management and planarity to support large surfaces and high pin counts at wafer test, High pin count MPU/GPU devices requiring final test digital performance and high current contacting, Consumer audio/video, mixed-signal and RF devices that are rapidly moving to wafer-level chip scale packaging (WLCSP) and require high performance probe test. Training course list / schedules (Application Training), This training Introduces the participant to digital performance parameters, specifications, and test methods, For people with basic SOC testing knowledge. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. The PowerMUX card offers a "sea of switches" for individual usage in typical power applications. TSE: 6857. This enhancement gives the V93000 sufficient power and enough analog and digital channels on a single platform to conduct highly parallel, cost-efficient testing of embedded power ICs. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analogas well as the lowest noise floor. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. 0000058780 00000 n Advantest T6573 SoC Test System Teradyne ETS 364 Mixed Signal Test System . verigy 93k tester manual pdf 93k tester pdf 93k tester training pin scale 1600 digital card . 0000006892 00000 n The result: excellent mechanical and electrical contact is assured. Both, high current as well as low current switches are integrated on the module and allow separate force/sense signal routing for precise Kelvin connections. The switches operate in a voltage range up to +/-120V and up to 5A pulse power and can be parallelized for higher current applications. 0000003026 00000 n The V93000 offers one single platform to cover the broad range of requirements to test the variety of wireless devices thus enabling unprecedented asset utilization and manufacturing flexibility. With 32 fully independent instruments per board and an additional PMU at each pogo, it can also perform highly accurate DC measurements. 0000011255 00000 n PDF Probe Card Test and Repair on a Probe Card Interface teradyne catalyst tester manual - thehungryhappyhippy.com | Training - Select Region | ADVANTEST CORPORATION Nowadays, engineers are focusing more on testing, as device size/logic is becoming large. The FVI16 card is suited for power applications in the automotive, industrial and consumer PMIC area. All Rights Reserved. ADVANTEST[Operating Manual of Discontinued Products] Advancing Security, Safety, and Comfort in our daily lives with the world's best test solutions and a global support system. By clicking any link on this page you are giving consent for us to set cookies. 0000007336 00000 n DC testing Shmoo tools, data logging, and histograms. Founded in Tokyo in 1954, Advantest is a global company with facilities. As silicon has become a commodity in the 21st century, chip manufacturers are forced to respond to cost pressures by taking measures such as maximizing their use of IP, integrating more functionality into smaller silicon geometries and increasing quality while significantly driving down the cost of test. January 22, 2021 Smart Coherence for SOC Test 1 Preface - ADVANTEST CORPORATION Agilent -Verigy 93000 and PS 93000 parts available. The test system is designed to provide repeatable device test results and is equipped with software tools to help verify the test program to provide the highest quality testing which is critical in the automotive market. The platform has become the all purpose reference platform. Outsourcing IDMs and fabless companies find V93000 test capacity installed in all leading OSATs worldwide. 0000018400 00000 n E-mail Kantor : spiuho@uho.ac.id Coverage of the "all digital" space from structural wafer sort to high end characterization test, from consumer space to high end all on one platform providing our customers the benefit of maximum versatility. V93000 Direct Probe 's innovative probe card design, places the probe assembly directly on the load board, improving test performance and reducing hardware cost and hardware design time from design to production. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. Verigy V93000 Pin Scale 1600 VelocityCAE. E-mail Admin : saprjo@yahoo.com. To remain on pace with the semiconductor technology advances leading to next-generation 5G wireless communications, testing capabilities for RF and mixed-signal ICs must reach new highs in parallelism and throughput. 0000011683 00000 n The V93000 is widely accepted at the leading IDMs, foundries and design houses. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. To significantly speed up test program development and with this reduce the time to market the V93000 provides a comprehensive ready to use demodulation library which covers all major standards and which is continuously extended. For people with basic SOC testing knowledge (e.g. 0000015761 00000 n ADVANTESTs Wave Scale generation of channel cards for the V93000 platform enable highly parallel multi-site and in-site testing that dramatically reduces the cost of test and ultimately the time to market for current and future devices. 0000033254 00000 n It combines this unique in-site parallelism with octal-site or more testing capabilities and high multi-site efficiency to dramatically reduce the cost of test for complex RF devices. Its leading-edge systems and products are integrated into the most advanced semiconductor production lines in the world. . The ongoing semiconductor integration trend leads to complex I/O structures which demand the connection of universal ATE resources featuring analog, mixed signal and digital capabilities on the same instrument channel. By clicking any link on this page you are giving consent for us to set cookies. Advantest's V93000 Direct Probesolution reduces the length and number of signal path transitions between tester and probe card enabling the industry's highest test performance to now be brought to wireless, WLCSP, MPU and GPU devices at wafer probe. Semiconductor test equipment supplier Advantest has introduced the newest generation of its Wave Scale RF channel cards for the V93000 platform to address the growing market demand for Wi-Fi 6E, 5G-NR transceivers, LTE-Advanced Pro and IoT communication devices operating at frequencies up to 8GHz. Automation Solutions Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 0000016567 00000 n Also, is a high precision VI resource for analog applications like power management. '.l!oUsV_Si/[I. Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. T2000. Older testers having single clock domains and primitive Per pin capabilities such as individual clock domain, high accuracy DC and industry-leading digital performance are expanded with the Pin Scale 1600. Floating VI Source for High Power Applications. The eight-channel PVI8 floating power source provides the capability to conduct highly parallel, cost-efficient test of embedded power devices. Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. 0000079887 00000 n n8TJ.Jc\2MUs3\ skM\0s\NY)%wIINi9#AsS,TQQ,z_TT9juF B|rKu6\"]]n Advantest. Click on more information for further details. Working closely with leading probe card manufacturers, Advantest has successfully overcome traditional barriers to delivering high performance test at wafer probe. The V93000 is the only single scalable platform ATE offering solutions from entry level consumer devices to the most complex high end integrated SoC requiring the full suite of capabilities: dc, digital, high speed digital, analog and RF. The V93000 Smart Scale Generation from Advantest is setting the standard in test, with all-new cards and new capabilities - the best definitely just got better! 0000059144 00000 n (Cut outs impact deflection/rigidity properties). DUT boards can be exchanged, as well as test programs. 0000085770 00000 n With it's breakthrough Direct Probe probe card interface technology the V93000 offers 4 times the component space on the probe card with optimal signal integrity to allow known good die testing with higher multisite already at probe. 0000079718 00000 n Pin configuration setup of levels, timing, and vectors. Release 5.4.3. Click on more information for further details. Advantest's Direct Probe reduces the length and number of signal-path connections between tester pin electronics and probe points, significantly improving signal integrity for device testing. Very high speed I/O technology, SerDes based (such as PCIe, USB, HDMI.. ) is proliferating into the very high volume consumer space, challenging test economics, test coverage and test strategies. PDF User Guide. 0000029728 00000 n The Wave Scale RF card uses four independent RF subsystems per board, each with eight ports. Universal Analog Pin covers widest application range. bT$nb$Zk5DUVR:;Vj}ow+8S(CfM2r%o90!h-/9' HLUPTG}@;O Powered by . User-specific tests are programmed with test methods in C. Links are available for design-to-test conversion. This class introduces the V93000 SOC Series (using Smart Scale cards). Current pogo tower-based wafer prober interfaces degrade signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. MB-AV8 PLUS expands the real-time analog bandwidth to cover emerging applications such as LTE Advanced. 0000321810 00000 n TEAM A.T.E. With the majority of the functionality tightly integrated into the system's test head, the platform offers superior speed, performance analog as well as the lowest noise floor. Whether you need to address very high node counts, address a high degree of parallelism and multisite efficiency, address large scan data volumes, support sophisticated power delivery or explore very high speeds or timing accuracy, the V93000 provides solutions across the entire space in one go. 0000252684 00000 n High rigidity for different application areas, All per-pin DC resources - leading maximum parallelism, Per-pin TMU - addressing the pervasive use of local PLL-based time domain synthesis avoiding special resources and routing, Per-pin sequencing - enabling flexible I/O port assignments and concurrent execution of multi domain functions, Versatile and scalable power supplys sources up to 500 A or more with exceptional load step response time, Flexible vector memory architecture and licensing options enabling a broad mix of deep scan to high speed functional tests. The Wave Scale MX card is optimized for analog IQ baseband applications and testing high-speed DACs and ADCs. 0000343418 00000 n (-{Q&.v1xRYdI~.4 nd|7I:aN!OM 0000002125 00000 n Advantest Corporation Superior cross platform compatibility allows our upstream customers to choose from state of the art latest systems or load the same base program on the large fleet of legacy V93000 system for the more mature products, thus picking optimum cost of test operating points. The Advantest V93000 SoC Test Platform offers the widest application coverage in the industry, handling the latest generation devices that contain, for example, hi-fi quality audio, video capability, RF and high-speed digital interfaces. With its flexibility, the Pin Scale 9G can test any combination of parallel or serial, single ended or differential, and uni- or bi-directional interfaces. V93000 Direct Probe interfaces the test head directly with the probe assembly, reducing the length and number of signal path transitions, maintaining signal integrity. While other systems test one RF standard per site at a time, this card enables simultaneous testing of multiple standards or multiple paths within each DUT. .4(m $8@ s9QXc&}Zu|'Zr;nJp1p!nOLOp,/WqB=W@0J;fVK8 .}yI#2@p8Y/m68Q{$nFRC Jh).b`WgUGotk7hO o}MT`.2'g(uTC)fnSAQ 0000013084 00000 n Advantest's Wave Scale generation of channel cards for the V93000 platform delivers unprecedented levels of parallelism and throughput in testing radio-frequency (RF) and mixed-signal #ICs for wireless communications. testing of symmetrical high-speed interfaces and enhanced SmarTest software functionality. After completion the student will be familiar with the following: Advantest Corporation Superior x/y repeatability after cleaning step. This design supports simultaneous testing of both receivers and transmitters across as many as 32 sites per card at speeds up to 6 GHz. 0000009007 00000 n Smarter Testing ADVANTEST's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Combined with the high density DUT power supply DPS128 the solution offers highly parallel test capability for MCUs with embedded analog cores as well as SmartCards and NFC controllers. This paragraph applies only to the extent permitted by applicable law. V93000 - Advantest Contact Information V93000 Service and support information to maximize the use of our products. As the figure shows, the combined solution consists of an Advantest V93000 tester and twinning test head extension from Advantest, to which MultiLane adds power, cooling and a backplane to create the HSIO card cage. 0000057829 00000 n Test cell throughput and multi-site efficiency have the highest impact on cost-of test (COT). Requires myAdvantest login and corresponding privileges. 0000013644 00000 n All features and performance points are available in all classes. 0000012048 00000 n V93000 Visionary and Enduring Architecture. 0000176239 00000 n Cost efficient parallel test capability is guaranteed by the 16 channel design, offering 250W of pulse power as well as 40W continuous rating on every channel. Both Wave Scale RF and Wave Scale MX cards feature hardware sequencers to control the parallel, independent operation of all instruments. 0000061569 00000 n TSE: 6857. The scalable platform architecture of the Advantest V93000 combines the highest speed digital test, precision analog and RF measurement into a single test system. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Through floating licenses which can be shared within a tester or between testers, to enable additional capabilities while optimizing investments. More information is available at www.advantest.com With high density cards, universal features and precision force and measurement capabilities the PAC solution enables leading CoT savings at high site count testing. The current industry standard for wafer prober interface (Pogo Tower) degrades the signal quality because the signal must pass through multiple transition points and a distance of 4 to 5 inches. 0000061958 00000 n Advantest's V93000 Smart Scale generation incorporates innovative per-pin testing capabilities. Staying focused on the single scalable platform strategy, Advantest has developed a significant installed base of V93000 test systems in both engineering and high volume manufacturing. 0000160939 00000 n Maximum Investment Protection and Flexibility, Advantest Corporation New technologies consistently come with new fail mechanisms, such that advanced silicon debug becomes an integral necessity in the race to market. This combined with lowest cost of tests results in a widespread market acceptance of the V93000 RF solution and sets a new standard for testing next generation RF devices. The Advantest bridge beams are specifically designed to match all application areas, featuring cut outs to provide the required instrument space, so that the new front-end modules can access the DUT interface board / probe card. TSE: 6857. Enable students to create semiconductor test programs on the V93000 test platform under SmarTest 8 software. Each pin runs it own sequencer program for maximum flexibility and performance, for example in multisite applications. 810~11. 0000007005 00000 n In myAdvantest portal you can then Request access to the Advantest Software Center if you have a service agreement with Advantest. For the OSATs the cross generation compatibility means maximum investment protection, optimum reuse of resources and a high degree of flexibility for load balancing within the fleet. 0000058694 00000 n Advantest Corporation 0000180605 00000 n The cards 300-MHz bandwidth allows it to handle the most advanced modulation standards while its flexible I/O matrix reduces loadboard complexity and boosts multi-site testing efficiency. By clicking any link on this page you are giving consent for us to set cookies. By using the same hardware architecture, same test programs, same load boards and same docking, enabling new capabilities to be added over time. Full test processor control ensures time synchronization between all card types, like digital, Power, RF, mixed signal and so on. Pin Scale SL extends the leadership in high speed ATE instrumentation into the 12.8/16G domain. yc+5I|w&-/-6d0E^ [6cf,/* With its scalable platform architecture, the V93000 tests a wide range of devices, from low cost IoT to high end, such as advanced automotive devices or highly integrated multicore processors. SOC ATE . V93000 Performance Board V93000 Visionary and Enduring Architecture Each of the four classes of V93000 Smart Scale Tester, A, C, S and L, has different sized test heads and provides the most efficient solution for user applications. Designed for highly parallel multi-site and in-site parallel testing, the new #V93000 Wave Scale RF and V93000 Wave Scale MX cards substantially reduce the cost of test and time to market for today's RF #semiconductors while creating a path for testing future 5G devices.The new cards target the RF and wireless communication market segments by providing highly efficient test solutions for the semiconductors that drive LTE, LTE-Advanced and LTE-A Pro smartphones as well as LTE-M, WLAN, GPS, ZigBee, Bluetooth and #IoT applications. hb```c``e`g`H @vf0=NeN(t)uN\Te:0A ---" d:} `IAFI |3#60ec8`@,5e- THp-`|1!A~/LBvI L10L~@ZARQL; l9jM"y(W&[|9icW0! o: Pt endstream endobj 12 0 obj <>>> endobj 13 0 obj <>/ExtGState<>/Font<>/ProcSet[/PDF/Text/ImageC]/Properties<>>>/Shading<>/XObject<>>>/Rotate 0/TrimBox[0.0 0.0 597.6 842.4]/Type/Page>> endobj 14 0 obj <> endobj 15 0 obj <>stream
Galesburg Silver Streaks Basketball,
Stevenson High School Grades,
Lenco Stone Picker For Sale,
Hhs Service Activation Home Warranty Division,
Washington Huskies Softball Recruiting 2023,
Articles A